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  • On wafer Continuous-Wave Load and Source Pull measurements at 2GHz

Our Lab is equipped with a Load and Source Pull measurements sistem based on a PAF Dragon Switch-Box, an Agilent Vector Network Analyzer and two manual Maury Microwave tuners. Currently we are able to measure On-Wafer Continuous Wave RF performance at 2GHz but the system can easily be extended up to 12GHz. The system is also used for short term Reliability RF Stress test since it is equipped with a Thermal Chuck that allows to test the devices up to 200°C.

  • Pulsed I-V measurements down to 80ns
  • Current Deep Level Transient Spectroscopy measurements