PowDeR:Lab capabilities: Difference between revisions
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(New page: On wafer Continuous-Wave Load and Source Pull measurements at 2GHz Pulsed I-V measurements down to 80ns Current Deep Level Transient Spectroscopy measurements) |
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On wafer Continuous-Wave Load and Source Pull measurements at 2GHz | *On wafer Continuous-Wave Load and Source Pull measurements at 2GHz | ||
Pulsed I-V measurements down to 80ns | *Pulsed I-V measurements down to 80ns | ||
Current Deep Level Transient Spectroscopy measurements | *Current Deep Level Transient Spectroscopy measurements | ||
Revision as of 11:30, 17 April 2008
- On wafer Continuous-Wave Load and Source Pull measurements at 2GHz
- Pulsed I-V measurements down to 80ns
- Current Deep Level Transient Spectroscopy measurements