Difference between revisions of "PowDeR:Lab capabilities"
Jump to navigation
Jump to search
(New page: On wafer Continuous-Wave Load and Source Pull measurements at 2GHz Pulsed I-V measurements down to 80ns Current Deep Level Transient Spectroscopy measurements) |
|||
| Line 1: | Line 1: | ||
| − | On wafer Continuous-Wave Load and Source Pull measurements at 2GHz | + | *On wafer Continuous-Wave Load and Source Pull measurements at 2GHz |
| − | Pulsed I-V measurements down to 80ns | + | *Pulsed I-V measurements down to 80ns |
| − | Current Deep Level Transient Spectroscopy measurements | + | *Current Deep Level Transient Spectroscopy measurements |
Revision as of 11:30, 17 April 2008
- On wafer Continuous-Wave Load and Source Pull measurements at 2GHz
- Pulsed I-V measurements down to 80ns
- Current Deep Level Transient Spectroscopy measurements
