Difference between revisions of "PowDeR/Lab Capabilities"
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| + | ==Measurement Systems== | ||
*'''On wafer Continuous-Wave Load and Source Pull measurements at 2GHz''' | *'''On wafer Continuous-Wave Load and Source Pull measurements at 2GHz''' | ||
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*'''Pulsed I-V measurements down to 80ns''' | *'''Pulsed I-V measurements down to 80ns''' | ||
*'''Current Deep Level Transient Spectroscopy measurements''' | *'''Current Deep Level Transient Spectroscopy measurements''' | ||
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| + | ==Measurement Instruments== | ||
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| + | *Agilent 33250A Function / Arbitrary Waveform Generator, 80 MHz | ||
| + | http://www.home.agilent.com/agilent/redirector.jspx?action=ref&cname=AGILENT_EDITORIAL&ckey=237965&lc=eng&cc=US&nfr=-536902257.536881980.07 | ||
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| + | *Agilent 8114A High Power Pulse Generator, 100 V / 2 A | ||
| + | http://www.home.agilent.com/agilent/redirector.jspx?action=ref&cname=AGILENT_EDITORIAL&cc=US&lc=eng&ckey=410642&nid=-536902258.536881953.07&pid=1000001735%3Aepsg%3Apro | ||
Revision as of 16:02, 9 May 2008
Home - Projects - Publications - Staff - Lab Capabilities - Thesis
Measurement Systems
- On wafer Continuous-Wave Load and Source Pull measurements at 2GHz
Our Lab is equipped with a Load and Source Pull measurements sistem based on a PAF Dragon Switch-Box, an Agilent Vector Network Analyzer and two manual Maury Microwave tuners. Currently we are able to measure On-Wafer Continuous Wave RF performance at 2GHz but the system can easily be extended up to 12GHz. The system is also used for short term Reliability RF Stress test since it is equipped with a Thermal Chuck that allows to test the devices up to 200°C.
- Pulsed I-V measurements down to 80ns
- Current Deep Level Transient Spectroscopy measurements
Measurement Instruments
- Agilent 33250A Function / Arbitrary Waveform Generator, 80 MHz
- Agilent 8114A High Power Pulse Generator, 100 V / 2 A
