PowDeR:Lab capabilities: Difference between revisions
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(New page: On wafer Continuous-Wave Load and Source Pull measurements at 2GHz Pulsed I-V measurements down to 80ns Current Deep Level Transient Spectroscopy measurements) |
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On wafer Continuous-Wave Load and Source Pull measurements at 2GHz | [http://www.dii.unimo.it/wiki/index.php/PowDeR_-_Power_devices%2C_Detectors_and_Reliability_Group Home] | ||
Pulsed I-V measurements down to 80ns | [http://www.dii.unimo.it/wiki/index.php/PowDeR:Current_and_past_research_projects Projects] | ||
Current Deep Level Transient Spectroscopy measurements | [http://www.dii.unimo.it/wiki/index.php/PowDeR:Publications Publications] | ||
[http://www.dii.unimo.it/wiki/index.php/PowDeR:Lab_capabilities Lab] | |||
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*'''On wafer Continuous-Wave Load and Source Pull measurements at 2GHz''' | |||
Our Lab is equipped with a Load and Source Pull measurements sistem based on a PAF Dragon Switch-Box, an Agilent Vector Network Analyzer and two manual Maury Microwave tuners. Currently we are able to measure On-Wafer Continuous Wave RF performance at 2GHz but the system can easily be extended up to 12GHz. The system is also used for short term Reliability RF Stress test since it is equipped with a Thermal Chuck that allows to test the devices up to 200°C. | |||
*Pulsed I-V measurements down to 80ns | |||
*Current Deep Level Transient Spectroscopy measurements | |||
Latest revision as of 06:28, 18 April 2008
Home Projects Publications Lab
- On wafer Continuous-Wave Load and Source Pull measurements at 2GHz
Our Lab is equipped with a Load and Source Pull measurements sistem based on a PAF Dragon Switch-Box, an Agilent Vector Network Analyzer and two manual Maury Microwave tuners. Currently we are able to measure On-Wafer Continuous Wave RF performance at 2GHz but the system can easily be extended up to 12GHz. The system is also used for short term Reliability RF Stress test since it is equipped with a Thermal Chuck that allows to test the devices up to 200°C.
- Pulsed I-V measurements down to 80ns
- Current Deep Level Transient Spectroscopy measurements